Advanced Computing in Electron Microscopy by Earl J. Kirkland PDF

By Earl J. Kirkland

ISBN-10: 1475744064

ISBN-13: 9781475744064

ISBN-10: 1475744080

ISBN-13: 9781475744088

Preface to moment variation a number of new themes were additional, a few small mistakes were corrected and a few new references were further during this version. New issues contain aberration corrected tools, scanning confocal mode of operations, Bloch wave eigenvalue equipment and parallel computing strategies. The ?rst variation - cluded a CD with desktop courses, which isn't integrated during this version. - stead the linked courses can be to be had on an linked site (currently people.ccmr.cornell.edu/˜kirkland,but could circulation as time is going on). I desire to thank Mick Thomas for getting ready the specimen used to list the picture in Fig.5.26 and to thank Stephen P. Meisburger for suggesting a fascinating organic specimen to exploit in Fig.7.24. back, I ask for forgiveness upfront for leaving out a few undoubtedlyoutstanding r- erences. I additionally ask for forgiveness for the as but undiscovered blunders that stay within the textual content. Earl J. Kirkland, December 2009 Preface to First variation photograph simulation has turn into a standard software in HREM (High answer El- tron Microscopy) in recent times. although, the literature at the topic is scattered between many alternative journals and convention lawsuits that experience happened within the final or 3 many years. it really is dif?cult for rookies to start during this ?eld.

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Extra resources for Advanced Computing in Electron Microscopy

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Chapter 4 Sampling and the Fast Fourier Thansform Image simulation or image processing with the computer presumes that the image is somehow represented inside the computer. A digital computer naturally operates on numerical data. Therefore an image must be represented as a two dimensional array of numbers inside the computer. Each number is one pixel or spot in the image whose intensity is proportional to its numerical value. The trick is to have a sufficiently large number of pixels so that when they are displayed as an image the individual numbers or pixels are not individually distinguishable.

ANNULAR DARK FIELD STEM 37 (a) 'Iii a. (b) 'Iii a. 9: The STEM probe intensity (approximate point spread function) when astigmatism is negligible versus normalized radius R = r(CsA3)-1/4 for various values of the normalized defocus D = /:If(C s A)-1/2 and objective aperture Kmax = kmax(CsA3)1/4. 5 The transfer function is just the inverse Fourier transform of the point spread function. 10. It is difficult to define an optimum defocus and aperture to produce the best probe for the highest resolution.

The final image recording process is only sensitive to the intensity of the electrons and not their amplitudes. This means that phase contrast must have a coherent image process to be sensitive to the phase of the electron via some interference process. Reducing the coherence of the imaging process should also reduce the phase contrast transfer function. The ratio (3max I U max can be used to control the coherence of the imaging process. Because the phase contrast image will likely disappear in an incoherent image the transmission function should include the possibility of amplitude contrast.

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Advanced Computing in Electron Microscopy by Earl J. Kirkland


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